Conference Contributions 2020
10th Conference on Industrial Computed Tomography (iCT Conference 2020), Wels, Austria, February 4 - February 7, 2020
Graded material inspection by X-ray computed tomography
N. Brierley and M. Kachelrieß
Benefits of photon counting detectors for beam hardening artifact reduction in industrial CT applications
P. Trapp, L. Klein, J. Maier, C. Amato, F. Ballach, M. Hammer, R. Christoph, C. Leinweber, S. Sawall, R. Christoph, and M. Kachelrieß