X-Ray Imaging and Computed Tomography

10th Conference on Industrial Computed Tomography (iCT Conference 2020)

Wels, Austria, February 4 - February 7, 2020

Graded material inspection by X-ray computed tomography
N. Brierley and M. Kachelrieß

Benefits of photon counting detectors for beam hardening artifact reduction in industrial CT applications
P. Trapp, L. Klein, J. Maier, C. Amato, F. Ballach, M. Hammer, R. Christoph, C. Leinweber, S. Sawall, R. Christoph, and M. Kachelrieß

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