X-Ray Imaging and Computed Tomography

2020 SPIE Medical Imaging Conference (SPIE 2020)

Houston, February 15 - February 20, 2020

Deep learning-aided CBCT image reconstruction of interventional material from four x-ray projections
E. Eulig, J. Maier, N.R. Bennet, M. Knaup, K. Hörndler, A. Wang, and M. Kachelrieß
Presentation

Can a deep learning neural network remove metal artefacts from clinical cone-beam CT?
M. Skaarup, J.M. Edmund, M. Kachelrieß, and I.R. Vogelius

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